A study was performed to evaluate the cross section and transient effects with a bias voltage of 3.6 V and 2.5 V. To capture different SET signatures events, the triggers was set with ±2.0°C variance. Initial temperature readings were recorded for the local channel and each remote channel. All device registers were read in 350 ms intervals and the current temperature readings were compared with the initial readings to record all events that exceeded ±2.0°C. To ensure that previous transients were not affecting subsequent register reads, a device reset was issued between each measurement. The TMP461-SP device supports reset using the two-wire general-call address 00h (0000 0000b). The TMP461-SP device acknowledges the general-call address and responds to the second byte. If the second byte is 06h (0000 0110b), the TMP461-SP device executes a software reset. This software reset restores the power-on reset state to all TMP461-SP registers and aborts any conversion in progress.

Heavy ions with LET_EFF 65.65 MeV-cm²/mg were used to irradiate the devices. Flux of 10⁵ ions/s-cm² and fluence of 10⁷ ions/cm² were used during the exposure at room temperature. The output temperature data was processed and analyzed. SET events were observed, the upper-bound cross-section (using a 95% confidence level) is calculated as:

σSEL ≤ 2.1 × 10^–6 cm² for LET_EFF = 65.65 MeV-cm²/mg and T = 25°C at 3.6 V.

σSEL ≤ 2.1 × 10^–6 cm² for LET_EFF = 65.65 MeV-cm²/mg and T = 25°C at 2.5 V.

Figure 5-2 Cross Section vs LET