SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

7 Single-Event Transients (SET)

SETs are defined as heavy-ion-induced transients upsets on the OUT pin of the INA901-SP. SET testing was performed at room temperature (no external temperature control applied). The highest energy ion used for the SET testing was a Holmium (67Ho) ion with an angle-of-incidence of 35° for an LETEFF = 93MeV × cm2 / mg. Flux of approximately 104 ions / cm2× s and a fluence of approximately 1 × 106 ions / cm2.

VOUT SETs were characterized using a window trigger of 6V ± 180mV (±3%) around the output voltage. The devices were characterized at three different VCM levels of 12V, 15V, and 48V. The IN- pin was set to VCM with a 300mV differential supply between IN- and IN+. The VCC supply was set to 12V for all ion runs.

To capture the SETs a NI-PXI-5172 scope card was used to continuously monitor the OUT. The output voltage was monitored by using the INA_OUT test point on the EVM.

The scope triggering from OUT was programmed to record 10k samples with a sample rate of 2M samples per second (S / s) in case of an event (trigger).

Under heavy-ions, the INA901-SP transient upsets that are all recoverable without any need for external intervention such as a power down or reset. There were two distinct signatures seen on the output of the INA901-SP.

Test conditions and results are listed in Table 7-2.

Table 7-1 Summary of INA901 SET Test Condition and Results
Run Number Unit Number VS(V) VCM(V) VDIFF(V) Distance (mm) Ion Angle (°) Flux
(ions × cm2 / mg)		 Fluence
(Number of ions)		 LETEFF
(MeV × cm2/ mg)		 Output Events
4 2 12V 12V 0.3 40 Ho 35° 1.00E+04 1.00E+06 93 1147
6 2 12V 15V 0.3 40 Ho 35° 1.00E+04 1.00E+06 93 1241
7 2 12V 48V 0.3 40 Ho 35° 1.00E+04 1.00E+06 93 1250
8 2 12V 12V 0.3 40 Ho 0° 1.00E+04 1.00E+06 75 1141
9 2 12V 15V 0.3 40 Ho 0° 1.00E+04 1.00E+06 75 1093
10 2 12V 48V 0.3 40 Ho 0° 1.00E+04 1.00E+06 75 1189
11 2 12V 12V 0.3 40 Ag 0° 1.00E+04 1.00E+06 48 697
13 2 12V 15V 0.3 40 Ag 0° 1.00E+04 1.00E+06 48.47 728
14 2 12V 48V 0.3 40 Ag 0° 1.00E+04 1.00E+06 48 808
16 2 12V 12V 0.3 40 Ag 35° 1.00E+04 1.00E+06 60 823
17 2 12V 15V 0.3 40 Ag 35° 1.00E+04 1.00E+06 60 808
18 2 12V 48V 0.3 40 Ag 35° 1.00E+04 1.00E+06 59.8 982
19 2 12V 12V 0.3 40 Ne 35° 1.00E+04 1.00E+06 3.44 1
20 2 12V 15V 0.3 40 Ne 35° 1.00E+04 1.00E+06 3.44 4
21 2 12V 48V 0.3 40 Ne 35° 1.00E+04 1.00E+06 3.44 3
22 2 12V 12V 0.3 40 Ne 0° 1.00E+04 1.00E+06 2.8 0
23 2 12V 15V 0.3 40 Ne 0° 1.00E+04 1.00E+06 2.8 2
24 2 12V 48V 0.3 40 Ne 0° 1.00E+04 1.00E+06 2.8 2

Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations , the upper-bound cross-section (using a 95% confidence level) is calculated for the different SETs as listed in Table 7-2, Table 7-3, and Table 7-4.

Table 7-2 Upper Bound Cross Section for Given LETEFF for VCM 12V
LETEFF (MeV cm2 / mg) Upper Bound Cross Section (cm2/ device)
93 1.22E-03
76 1.21E-03

60

 7.51E-04
48 8.81E-04
3.44 5.57E-06
2.8 3.69E-06
Table 7-3 Upper Bound Cross Section for Given LETEFF for VCM 15V
LETEFF (MeV cm2 / mg) Upper Bound Cross Section (cm2 / device)
93 1.31E-03
76 1.16E-03

60

 7.83E-04
48 8.66E-04
3.44 1.02E-05
2.8 7.22E-06
Table 7-4 Upper Bound Cross Section for Given LETEFF for VCM 48V
LETEFF (MeV cm2/mg) Upper Bound Cross Section (cm2 / device)
93 1.32E-03
76 1.26E-03

60

 8.66E-04
48 1.05E-03
3.4 8.77E-06
2.8 7.22E-06
GUID-20240315-SS0I-TLDM-XSPF-W21QMWDTHQVR-low.svg Figure 7-1 Histogram of the Amplitude for the Positive VOUT SETs on Run 4, VCM = 12V, LETEFF = 93MeV

Transients greater than 2.25V above the nominal output were limited by the measurement range of the digitizer. These limitations did not exist for negative transient which showed these disturbances can be as high as 5.6V.

GUID-20240315-SS0I-TTR0-T8QK-FBGDK9B9BX3J-low.svg Figure 7-2 Histogram of the Amplitude for the Negative VOUT SETs on Run 4, VCM = 12V, LETEFF= 93MeV
GUID-20240315-SS0I-X2T8-11VR-TXD9WQ9JT9BX-low.svg Figure 7-3 Histogram of the Pulse Width for the Positive VOUT SETs on Run 4, VCM = 12V, LETEFF= 93MeV
GUID-20240315-SS0I-RB2N-CTHT-9BPFT3MPLXHZ-low.svg Figure 7-4 Histogram of the Amplitude for the Positive VOUT SETs on Run 6, VCM = 15V, LETEFF= 93MeV

Transients greater than 2.25V above the nominal output were limited by the measurement range of the digitizer. These limitations did not exist for negative transient which showed these disturbances can be as high as 5.6V.

GUID-20240315-SS0I-8RTJ-HZBP-BWNLZNN8MLS7-low.svg Figure 7-5 Histogram of the Amplitude for the Negative VOUT SETs on Run # 6, VCM = 15V, LETEFF= 93MeV
GUID-20240318-SS0I-B5JZ-NBHD-9LTBQFJCS7L7-low.svg Figure 7-6 Histogram of the Pulse Width for the Positive VOUT SETs on Run 6, VCM = 15V, LETEFF= 93MeV
GUID-20240315-SS0I-RHJX-KDH9-M9DPFZSZDZSC-low.svg Figure 7-7 Histogram of the Amplitude for the Positive VOUT SETs on Run 7, VCM = 48V, LETEFF= 93MeV

Transients greater than 2.25V above the nominal output were limited by the measurement range of the digitizer. These limitations did not exist for negative transient which showed these disturbances can be as high as 5.6V.

GUID-20240315-SS0I-BKHS-CKRW-ZF67QWKKW8SG-low.svg Figure 7-8 Histogram of the Amplitude for the Negative VOUT SETs on Run 7, VCM = 48V, LETEFF= 93MeV
GUID-20240318-SS0I-WXQT-3X0R-P6WFQHHJNJ9T-low.svg Figure 7-9 Histogram of the Pulse Width for the Positive VOUT SETs on Run 7, VCM = 48V, LETEFF= 93MeV
GUID-20240315-SS0I-DJNT-KMRM-VMDNMBSC1ZJF-low.svg Figure 7-10 Histogram of the Amplitude for the Positive VOUT SETs on Run 19, VCM = 12V, LETEFF= 3.44MeV
GUID-20240315-SS0I-KVVH-2BMZ-LVLB56VF4KXH-low.svg Figure 7-11 Histogram of the Pulse Width for the Positive VOUT SETs on Run 19, VCM = 12V, LET= 3.44MeV
GUID-20240315-SS0I-52JX-VJPK-C5ZGQ294X2ZX-low.svg Figure 7-12 Histogram of the Amplitude for the Negative VOUT SETs on Run 20, VCM = 15V, LET= 3.44MeV

There where no positive transients for Run 20.

GUID-20240315-SS0I-NZ1Z-C9CN-9JKM3ZPWPGTF-low.svg Figure 7-13 Histogram of the Pulse Width for the Positive VOUT SETs on Run 20, VCM = 15V, LETEFF= 3.44MeV
GUID-20240315-SS0I-0D42-4C9D-5DMRLVNQT8H5-low.svg Figure 7-14 Histogram of the Amplitude for the Positive VOUT SETs on Run 21, VCM = 48V, LETEFF= 3.44MeV
GUID-20240315-SS0I-NP50-SXPC-G1MPZPLQDZTK-low.svg Figure 7-15 Histogram of the Pulse Width for the Positive VOUT SETs on Run 21, VCM = 48V, LETEFF= 3.44MeV
GUID-20240207-SS0I-RLJW-DZCG-P48DMZZLRDXB-low.svg Figure 7-16 Most severe observed VOUT Transient, VCM = 15V, LETEFF = 93MeV, Run 6