SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

9 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the INA901-SP current sense amplifier. Heavy-ions ranging from LETEFF = 2.8 to LETEFF = 93MeV × cm2/ mg were used for the SEE characterization campaign. Flux of 104 and 105 ions/cm2× s and fluences ranging from 1 × 106 to 3 × 106 ions / cm2 per run were used for the characterization. The SEE results demonstrated that the INA901-SP is SEL-free up to LETEFF = 93MeV × cm2 / mg and across the full electrical specifications. Transients for LETEFF levels from 2.8 to 93MeV × cm2 / mg on OUT are shown and discussed. CREME96-based worst-week event-rate calculations for LEO(ISS) and GEO orbits for the DSEE are shown for reference.