SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

1 Introduction

The INA901-SP device is a radiation-hardened, voltage-output, current-sense amplifier that can sense drops across shunt resistors at common-mode voltages from –15V to 65V, independent of supply voltage. The INA901-SP pinouts readily enable filtering.

Table 1-1 lists general device information and test conditions. For more detailed technical specifications and links to related documentation, see the INA901-SP Radiation Hardened, –15-V to 65-V Common Mode, Unidirectional Current-Shunt Monitor data sheet

Table 1-1 Overview Information
Description(1)Device Information
TI Part NumberINA901-SP
SMD Number5962-1821001VXC
Device FunctionCurrent Sense Amplifier
TechnologyLBC-S0I
Exposure FacilityRadiation Effects Facility, Cyclotron Institute, Texas A&M University
Heavy Ion Fluence per Run1 × 107 ions / cm2
Irradiation Temperature125°C
(1) TI may provide technical, applications or design advice, quality characterization, and reliability data or service, providing these items shall not expand or otherwise affect TI's warranties as set forth in the Texas Instruments Incorporated Standard Terms and Conditions of Sale for Semiconductor Products and no obligation or liability shall arise from Semiconductor Products and no obligation or liability shall arise from TI's provision of such items.