SBOK045 March   2024 INA901-SP

 

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Introduction
  5. 2Single-Event Effects (SEE)
  6. 3Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Test Setup and Procedures
  9. 6Destructive Single-Event Effects (DSEE)
    1. 6.1 Single-Event Latch-up (SEL) Results
  10. 7Single-Event Transients (SET)
  11. 8Event Rate Calculations
  12. 9Summary
  13.   A References

Device and Test Board Information

The INA901-SP is packaged in a 8-pin HKX package.Figure 3-1 shows the pinout diagram. The evaluation board used for the SEE characterization is shown in Figure 3-2 and schematics are shown in Figure 3-3. During the testing, the LM193AJRLQMLV device was not populated on the EVM.

GUID-FB3EC4E7-8F8D-4871-B411-90E8669630DE-low.png

Note that the package was delidded to reveal the die face for all heavy-ion testing.

Figure 3-1 INA901-SP Pinout
GUID-20240315-SS0I-MFBN-SVTF-Q6MX72GHBVBN-low.svg Figure 3-2 INA901-SP Evaluation Board
GUID-B4787106-EEBB-4079-BDDC-15D35777C79F-low.gif Figure 3-3 INA901-SP Evaluation Board Schematic