SBOK046 December   2020 TMP9A00-EP

 

  1.   Trademarks
  2. 1Introduction
  3. 2Device Qualification
  4. 3Technology Family FIT and MTBF Data
  5. 4 Device Family Qualification Data
  6. 5 Ongoing Reliability Monitoring
  7. 6Summary

3 Technology Family FIT and MTBF Data

Mean Time Between Fails (MTBF) and Failures in Time (FIT) rates are device reliability statistics calculated based on data collected from TI’s internal reliability testing (life test).

TI’s DPPM/FIT/MTBF Estimator Search Tool reports the generic data based on technology groupings and shows conditions under which the rates were derived. All terms used in the tool and definitions can be found on the TI reliability terminology page. Failure rates are summarized by technology and mapped to the associated material part numbers. The failure rates are highly dependent on the number of units tested, therefore, it is not recommended to compare failure rates.

TI DPPM/FIT/MTBF Estimator Search Tool web page link:

www.ti.com/quality/docs/estimator.tsp