SBOK049 November 2023 OPA4H014-SEP
PRODUCTION DATA
There were no functional failures at any irradiation level. Parametric drift to levels outside the data sheet specifications was observed on all devices for the input bias current (and related input offset current) parameter, and on all but one device for the input offset voltage. Some devices experienced parametric drift for open-loop gain. All other tested parameters were observed to be within the test limits of the ATE program for the device, and as a result, within the data sheet specifications.