SBOK051 November   2023 OPA4H014-SEP

PRODUCTION DATA  

  1.   1
  2.   OPA4H014-SEP Radiation Tolerant High-Speed, Quad-Channel Operational Amplifier TID Report
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased Device Configuration
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose Characterization Test Results
    1. 3.1 HDR Characterization Results
    2. 3.2 LDR Characterization Results
    3. 3.3 ELDRS Characterization Results
    4. 3.4 Summary of Results
  7.   A High Dose Rate Total Ionizing Dose Report
  8.   B Low Dose Rate Total Ionizing Dose Report

2.1 Test Overview

The OPA4H014-SEP samples, in a biased configuration, were irradiated at a high dose rate of 50-300 rad(Si)/s up to a maximum of 30 krad(Si) and then put through full electrical parametric testing on the production Automated Test Equipment (ATE). Three additional samples were irradiated to 50 krad(Si) for one-time characterization, following the same procedure.

Since the OPA4H014-SEP BICOM-3XHV process technology contains bipolar components, biased and unbiased LDR are also performed, up to 30 krad(Si). Parametric values from HDR and LDR results are compared to determine that the OPA4H014-SEP is not considered Enhanced Low Dose Rate Sensitive (ELDRS).