SBOK051 November   2023 OPA4H014-SEP

PRODUCTION DATA  

  1.   1
  2.   OPA4H014-SEP Radiation Tolerant High-Speed, Quad-Channel Operational Amplifier TID Report
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Product Description
    2. 1.2 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased Device Configuration
    4. 2.4 Test Configuration and Condition
  6. 3Total Ionizing Dose Characterization Test Results
    1. 3.1 HDR Characterization Results
    2. 3.2 LDR Characterization Results
    3. 3.3 ELDRS Characterization Results
    4. 3.4 Summary of Results
  7.   A High Dose Rate Total Ionizing Dose Report
  8.   B Low Dose Rate Total Ionizing Dose Report

2.3.1 Biased Device Configuration

Figure 2-1 shows the bias conditions for each pin during irradiation. A single-ended supply of 18 V was used for V+. Figure 2-2 shows an example of one of the bias boards used for the testing.

GUID-20230714-SS0I-KVWT-SZKG-8PZ3ZBWFJRTN-low.svg Figure 2-1 OPA4H014-SEP Bias Diagram
GUID-20230714-SS0I-5FMR-PD7G-THLL9RBVW9BH-low.png Figure 2-2 OPA4H014-SEP TID Bias Board