SBOK052 May   2024 OPA4H014-SEP

 

  1.   1
  2.   OPA4H014-SEP Single-Event Latch-Up (SEL) Radiation Report
  3.   Trademarks
  4. 1Overview
  5. 2SEE Mechanisms
  6. 3Irradiation Facilities and Telemetry
  7. 4Test Device and Test Board Information
    1. 4.1 Qualification Devices and Test Board
    2. 4.2 Characterization Devices and Test Boards
  8. 5Results
    1. 5.1 SEL Qualification Results
    2. 5.2 SET Characterization Results: TAMU K500 Cyclotron
    3. 5.3 SEE Characterization Results: MSU FRIB Linac
    4. 5.4 Analysis
    5. 5.5 Weibull Fit
  9. 6Summary
  10.   A TAMU Results Appendix
  11.   B MSU Results Appendix
  12.   C Confidence Interval Calculations
  13.   D References

4.1 Qualification Devices and Test Board

The OPA4H014-SEP was biased in a buffer condition, where V+ was set to 9V and V- was set to -9V. On all four channels, the inverting input was connected to the output and the non-inverting input was grounded to midsupply. Current was monitored over time for both V+ and V-. Heavy ions with LETEFF = 43MeV-cm2 / mg were used to irradiate the devices. A nominal flux of 105 ions / s-cm2 and fluence of 107 ions / cm2 were used during the exposure at 125°C. Two runs were completed to provide an overall fluence of 2 × 107 ions / cm2.

OPA4H014-SEP SEL Qualification Bias Diagram Figure 4-2 OPA4H014-SEP SEL Qualification Bias Diagram