SBOK052
May 2024
OPA4H014-SEP
1
OPA4H014-SEP Single-Event Latch-Up (SEL) Radiation Report
Trademarks
1
Overview
2
SEE Mechanisms
3
Irradiation Facilities and Telemetry
4
Test Device and Test Board Information
4.1
Qualification Devices and Test Board
4.2
Characterization Devices and Test Boards
5
Results
5.1
SEL Qualification Results
5.2
SET Characterization Results: TAMU K500 Cyclotron
5.3
SEE Characterization Results: MSU FRIB Linac
5.4
Analysis
5.5
Weibull Fit
6
Summary
A TAMU Results Appendix
B MSU Results Appendix
C Confidence Interval Calculations
D References
B
MSU Results Appendix
Figure B-1
Transient Event Magnitude Histogram, 4.5V Supply, LETeff = 50.4MeV-cm
2
/ mg
Figure B-3
Transient Event Magnitude Histogram, 4.5V Supply, LETeff = 50.4MeV-cm
2
/ mg, T
J
= 125°C
Figure B-5
VCC Supply Current, 4.5V Supply, LETeff = 50.4MeV-cm
2
/ mg, T
J
= 125°C
Figure B-7
VEE Supply Current, 4.5V Supply, LETeff = 50.4MeV-cm
2
/ mg, T
J
= 125°C
Figure B-9
MSU Run 77, Event 64, VOUT1
Figure B-2
Transient Event Magnitude Histogram, 18V Supply, LETeff = 50.4MeV-cm
2
/ mg
Figure B-4
Transient Event Magnitude Histogram, 18V Supply, LETeff = 50.4MeV-cm
2
/ mg, T
J
= 125°C
Figure B-6
VCC Supply Current, 18V Supply, LETeff = 50.4MeV-cm
2
/ mg, T
J
= 125°C
Figure B-8
VEE Supply Current, 18V Supply, LETeff = 50.4MeV-cm
2
/ mg, T
J
= 125°C