SBOK061 October   2022 SN54SLC8T245-SEP

 

  1.   SN54SLC8T245-SEP Single-Event Effects (SEE)
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Results
    1. 5.1 Single Event Latchup (SEL) Results
    2. 5.2 Single Event Transient (SET) Results
    3. 5.3 Event Rate Calculations
  8. 6Summary
  9.   A References

5.2 Single Event Transient (SET) Results

SETs are defined as heavy-ion-induced transients upsets on VOUT of the TPS7H1210-SEP. SET testing was performed at around 25°C. The species used for the SET testing was a Silver (109Ag) ion with an angle-of incidence of 0° for an LETEFF = 43 MeV·cm2 /mg. Flux of approximately 9.6× 103 to 1.1 × 104 ions/cm2 ·s and a fluence of approximately 1 × 106 ions/cm2 were used for the twelve SET runs.

Figure 3-2 shows the three main scenarios that were tested. The device was configured with clock signals ranging from 100 kHz to 5 MHz as inputs for channels A2 and A7.

Table 5-2 Summary of SN54SLC8T245-SEP SET Test Condition and Results
RUN # LETEFF (MeV·cm2/mg) ANGLE(°) DISTANCE (mm) FLUX (ions·cm2/mg) FLUENCE
(# ions)		 UNIFORM VCCA (V) VCCB (V) INPUT FREQ. PULSE WIDTH SAMPLING RATE EVENT COUNT
1 43 0 40 9.7 × 103 1 × 106 99% 1 V 1 V 1 MHz 2 µs/div 200 MS/s 0
2 43 0 40 9.6 × 103 1 × 106 99% 1 V 1 V 1 MHz 10 µs/div 200 MS/s 0
3 43 0 40 1.1 × 104 1 × 106 99% 1 V 1 V 1 MHz 10 µs/div 200 MS/s 0
5 43 0 40 1.17 × 104 1 × 106 99% 3.3 V 3.3 V 5 MHz 1 µs/div 1 GS/s 0
6 43 0 40 1 × 104 1 × 106 98% 3.3 V 3.3 V 5 MHz 1 µs/div 1 GS/s 0
7 43 0 40 1 × 104 1 × 106 98% 1 V 1 V 5 MHz 1 µs/div 1 GS/s 0
8 43 0 40 1.09 × 104 1 × 106 98% 1.8 V 1.8 V 5 MHz 1 µs/div 1 GS/s 0
9 43 0 40 1.1 × 104 1 × 106 98% 3.3 V 1 V 5 MHz 1 µs/div 1 GS/s 0
10 43 0 40 1.1 × 104 1 × 106 98% 2.5 V 1 V 5 MHz 1 µs/div 1 GS/s 0
11 43 0 40 1.1 × 104 1 × 106 98% 1 V 3.3 V 5 MHz 1 µs/div 1 GS/s 0
12 43 0 40 1.08 × 104 1 × 106 97% 3 V 1 V 5 MHz 1 µs/div 1 GS/s 0
13 43 0 40 1.1 × 104 1 × 106 97% 3.3 V 3.3 V 100 kHz 50 µs/div 20 MS/s 0

Using the MFTF method described in Single-Event Effects (SEE) Confidence Interval Calculations application report, the upper-bound cross section (using a 95% confidence level) is calculated as:

Equation 2. σSET ≤ 3.69 × 10-6 cm2device for LETEFF = 43 MeV × cm2mg and T = 25°C