SBOK070 November   2022 OPA4H199-SEP

 

  1.   OPA4H199-SEP Single-Event Latch-Up (SEL) Radiation Report
  2.   Trademarks
  3. 1Overview
  4. 2SEE Mechanisms
  5. 3Test Device and Test Board Information
  6. 4Irradiation Facility and Setup
  7. 5Results
    1. 5.1 SEL Results
  8. 6Summary
  9.   A Confidence Interval Calculations
  10.   B References

3 Test Device and Test Board Information

The OPA4H199-SEP is packaged in a 14-pin, SOT-23-THIN (DYY) package shown with pinout in Figure 3-1. Figure 3-2 shows the OPA4H199-SEP bias diagram.

OPA4H199-SEP pinout diagram. The package was decap’ed to reveal the die face for all heavy ion testing.
Figure 3-1 OPA4H199-SEP Pinout Diagram
Figure 3-2 OPA4H199-SEP SEL Bias Diagram