SBOK077 september   2023 SN54SC4T08-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Biased
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data

2.3.1 Biased

Figure 2-1 shows the bias conditions for each pin during irradiation.

GUID-20230818-SS0I-DQC6-QJG0-CDTLSBHLCGW4-low.svgFigure 2-1 SN54SC4T08-SEP Biased Diagram