SBOK085 April   2024 SN54SC2T74-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Overview
  5. 2Single-Event Effects (SEE)
  6. 3Test Device and Test Board Information
  7. 4Irradiation Facility and Setup
  8. 5Results
    1. 5.1 SEL Results
    2. 5.2 Single-Event Transients (SET)
    3. 5.3 Event Rate Calculations
  9. 6Summary
  10. 7References

5.1 SEL Results

During SEL characterization, the device was heated using forced hot air, maintaining device temperature at 125°C. A FLIR (FLIR ONE Pro LT) thermal camera was used to validate die temperature to make sure the device was accurately heated (see SN54SC2T74-SEP Thermal Image for SEL.) The species used for SEL testing was a Silver (109Ag) ion at 15MeV / µ with an angle-of-incidence of 0° for an LETEFF of 43MeV-cm2/ mg. A fluence of approximately 1 × 107 ions / cm2 was used for the runs.

The three devices were powered up and exposed to the heavy-ions using the maximum recommended supply voltage of 5.5V using a National Instruments™ PXI Chassis PXIe-4139 and a 5V, 1MHz square wave input using a Tektronix® AFG3102 function generator. The run duration to achieve this fluence was approximately 90 seconds. As listed in Table 5-2, no SEL events were observed during the nine runs, indicating that the SN54SC2T74-SEP is SEL-free. Figure 5-1, Figure 5-2, and Figure 5-3 show the plots of current versus time for runs one, four, and seven, respectively.

Table 5-1 Summary of SN54SC2T74-SEP SEL Test Conditions and Results
Run NumberUnit NumberDistance (mm)Temperature
(°C)		IonAngleFlux
(ions × cm2 / mg)		Fluence
(Number of ions)		LETEFF
(MeV × cm2/mg)		Did an SEL event occur?
1140124Ag0°1.00E+051.00E+0743No
2140124Ag0°1.00E+051.00E+0743No
3140124Ag0°1.00E+051.00E+0743No
4240123Ag0°1.00E+051.00E+0743No
5240123Ag0°1.00E+051.00E+0743No
6240123Ag0°1.00E+051.00E+0743No
7340124Ag0°1.00E+051.00E+0743No
8340124Ag0°1.00E+051.00E+0743No
9340124Ag0°1.00E+051.00E+0743No
GUID-20231103-SS0I-FJTK-TPGX-P1SZSM3DF81K-low.pngFigure 5-1 Current versus Time for Run 1 of the SN54SC2T74-SEP at T = 125°C
GUID-20231103-SS0I-MR1G-1B8T-LW4LMCQLW1XQ-low.pngFigure 5-2 Current versus Time for Run 4 of the SN54SC2T74-SEP at T = 125°C
GUID-20231103-SS0I-LCTX-R46F-JGBHHM0CH22L-low.pngFigure 5-3 Current versus Time for Run 7 of the SN54SC2T74-SEP at T = 125°C

No SEL events were observed, indicating that the SN54SC2T74-SEP is SEL-immune at LETEFF = 43MeV-cm2 / mg and T = 125°C. Using the MFTF method shown in Single-Event Effects (SEE) Confidence Internal Calculations , the upper-bound cross-section (using a 95% confidence level) is calculated as:

Equation 1. σSEL≤1.23×10-7cm2/device for LETEFF=43 MeV∙cm2/mg and T=125℃