SBOK092 December   2024 OPA4H199-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the OPA4H199-SP. Heavy-ions with LETEFF of 65 MeV × cm2 / mg were used to irradiate four production devices. Flux of approximately 105 ions/cm2 × s and fluence of 107 ions / cm2 per run were used for the characterization. The results demonstrated that the OPA4H199-SP is SEL-free up to 65 MeV·cm2/ mg at T = 125°C. The output signal, VOUT, (5% window) was monitored to check for transients and SEFIs. The results showed the device is SET free up to 65 MeV × cm2/ mg at T = 25°C.