SBOK092 December   2024 OPA4H199-SP

 

  1.   1
  2.   2
  3.   Trademarks
  4. 1 Introduction
  5. 2 Single-Event Effects (SEE)
  6. 3 Device and Test Board Information
  7. 4 Irradiation Facility and Setup
  8. 5 Depth, Range, and LETEFF Calculation
  9. 6 Test Setup and Procedures
  10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
  11. 8 Single-Event Transients (SET)
  12. 9 Event Rate Calculations
  13. 10Summary
  14.   A Total Ionizing Dose from SEE Experiments
  15.   B References

1 Introduction

The OPA4H199-SP is a 40V operational amplifier and is optimized for use in a space environment. The device offers exceptional DC precision and AC performance, including rail-to-rail input/output, low offset (±125µV, typ), low offset drift (±0.3µV/°C, typ), low noise (10.8 nV/√Hz and 1.8µVPP), and 4.5MHz bandwidth.

The wide voltage range of the OPA4H199-SP enables the device to be used in low voltage domains, such as 3.3V and 5V, or higher voltage ranges up to 40V. Unique features such as differential and common-mode input voltage range to the supply rail, high output current (±75mA), high slew rate (21V/µs), and high capacitive load drive (1nF) make the OPA4H199-SP a robust, high performance operational amplifier for high-voltage space applications.

The OPA4H199-SP is available in a small-sized, radiation-hardened plastic, 14-pin SOT-23 (DYY) package. The SOT-23 (DYY) package has a body size that is less than 1/5th of the size of traditional 14-pin ceramic packages. The OPA4H199-SP is specified from –55°C to 125°C.

Table 1-1 Overview Information
Description (1) Device Information
TI Part Number OPA4H199-SP
Orderable Number (SMD Number) 5962R2321401PXE
Device Function Operational Amplifier (Op-amp)
Technology LBC9 (Linear BiCMOS 9)
Exposure Facility Radiation Effects Facility, Cyclotron Institute, Texas A&M University
Heavy Ion Fluence per Run 1.00 × 106(SET) – 1.00 × 107 (for SEL and SET) ions / cm2
Irradiation Temperature 25°C (for SET testing) and 125°C (for SEL testing)
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