SBOS165B September   2000  – April 2024 OPA627 , OPA637

PRODMIX  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information: OPA627
    5. 5.5 Thermal Information: OPA637
    6. 5.6 Electrical Characteristics: OPA627BU, OPA627AU
    7. 5.7 Electrical Characteristics: OPA627AM, OPA627BM, OPA627SM
    8. 5.8 Electrical Characteristics: OPA637
    9. 5.9 Typical Characteristics
  7. 6 Detailed Description
    1. 6.1 Overview
    2. 6.2 Functional Block Diagram
    3. 6.3 Feature Description
      1. 6.3.1 Offset Voltage Adjustment
      2. 6.3.2 Noise Performance
      3. 6.3.3 Input Bias Current
      4. 6.3.4 Phase-Reversal Protection
      5. 6.3.5 Output Overload
      6. 6.3.6 Capacitive Loads
      7. 6.3.7 Input Protection
      8. 6.3.8 EMI Rejection Ratio (EMIRR)
        1. 6.3.8.1 EMIRR IN+ Test Configuration
      9. 6.3.9 Settling Time
    4. 6.4 Device Functional Modes
  8. 7 Application and Implementation
    1. 7.1 Application Information
    2. 7.2 Typical Application
      1. 7.2.1 Design Requirements
      2. 7.2.2 Detailed Design Procedure
      3. 7.2.3 Application Curve
    3. 7.3 Power Supply Recommendations
    4. 7.4 Layout
      1. 7.4.1 Layout Guidelines
      2. 7.4.2 Layout Example
  9. 8 Device and Documentation Support
    1. 8.1 Device Support
      1. 8.1.1 Development Support
        1. 8.1.1.1 TINA-TI™ Simulation Software (Free Download)
        2. 8.1.1.2 Analog Filter Designer
        3. 8.1.1.3 TI Reference Designs
    2. 8.2 Documentation Support
      1. 8.2.1 Related Documentation
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  10. 9 Revision History
  11. 10Mechanical, Packaging, and Orderable Information

8.6 Electrostatic Discharge Caution

GUID-D6F43A01-4379-4BA1-8019-E75693455CED-low.gif This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.