SBOS853A March   2017  – December 2018 OPT3001-Q1

PRODUCTION DATA.  

  1. 1 Features
  2. 2 Applications
  3. 3 Description
    1.     Block Diagram
    2.     Spectral Response: OPT3001-Q1 and the Human Eye
  4. 4 Revision History
  5. 5 Description (continued)
  6. 6 Pin Configuration and Functions
    1.     Pin Functions
  7. 7 Specifications
    1. 7.1 Absolute Maximum Ratings
    2. 7.2 ESD Ratings
    3. 7.3 Recommended Operating Conditions
    4. 7.4 Thermal Information
    5. 7.5 Electrical Characteristics
    6. 7.6 Timing Requirements
    7. 7.7 Typical Characteristics
  8. 8 Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Human Eye Matching
      2. 8.3.2 Automatic Full-Scale Range Setting
      3. 8.3.3 Interrupt Operation, INT Pin, and Interrupt Reporting Mechanisms
      4. 8.3.4 I2C Bus Overview
        1. 8.3.4.1 Serial Bus Address
        2. 8.3.4.2 Serial Interface
    4. 8.4 Device Functional Modes
      1. 8.4.1 Automatic Full-Scale Setting Mode
      2. 8.4.2 Interrupt Reporting Mechanism Modes
        1. 8.4.2.1 Latched Window-Style Comparison Mode
        2. 8.4.2.2 Transparent Hysteresis-Style Comparison Mode
        3. 8.4.2.3 End-of-Conversion Mode
        4. 8.4.2.4 End-of-Conversion and Transparent Hysteresis-Style Comparison Mode
    5. 8.5 Programming
      1. 8.5.1 Writing and Reading
        1. 8.5.1.1 High-Speed I2C Mode
        2. 8.5.1.2 General-Call Reset Command
        3. 8.5.1.3 SMBus Alert Response
    6. 8.6 Register Maps
      1. 8.6.1 Internal Registers
        1. 8.6.1.1 Register Descriptions
          1. 8.6.1.1.1 Result Register (offset = 00h)
            1. Table 7. Result Register Field Descriptions
          2. 8.6.1.1.2 Configuration Register (offset = 01h) [reset = C810h]
            1. Table 10. Configuration Register Field Descriptions
          3. 8.6.1.1.3 Low-Limit Register (offset = 02h) [reset = C0000h]
            1. Table 11. Low-Limit Register Field Descriptions
          4. 8.6.1.1.4 High-Limit Register (offset = 03h) [reset = BFFFh]
            1. Table 13. High-Limit Register Field Descriptions
          5. 8.6.1.1.5 Manufacturer ID Register (offset = 7Eh) [reset = 5449h]
            1. Table 14. Manufacturer ID Register Field Descriptions
          6. 8.6.1.1.6 Device ID Register (offset = 7Fh) [reset = 3001h]
            1. Table 15. Device ID Register Field Descriptions
  9. 9 Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 Electrical Interface
      2. 9.1.2 Optical Interface
    2. 9.2 Typical Application
      1. 9.2.1 Design Requirements
      2. 9.2.2 Detailed Design Procedure
        1. 9.2.2.1 Optomechanical Design
        2. 9.2.2.2 Dark Window Selection and Compensation
      3. 9.2.3 Application Curves
    3. 9.3 Do's and Don'ts
  10. 10Power Supply Recommendations
  11. 11Layout
    1. 11.1 Layout Guidelines
    2. 11.2 Layout Example
  12. 12Device and Documentation Support
    1. 12.1 Documentation Support
      1. 12.1.1 Related Documentation
    2. 12.2 Receiving Notification of Documentation Updates
    3. 12.3 Community Resources
    4. 12.4 Trademarks
    5. 12.5 Electrostatic Discharge Caution
    6. 12.6 Glossary
  13. 13Mechanical, Packaging, and Orderable Information
    1. 13.1 Soldering and Handling Recommendations
    2. 13.2 DNP (S-PDSO-N6) Mechanical Drawings

8.3.3 Interrupt Operation, INT Pin, and Interrupt Reporting Mechanisms

The device has an interrupt reporting system that allows the processor connected to the I2C bus to go to sleep, or otherwise ignore the device results, until a user-defined event occurs that requires possible action. Alternatively, this same mechanism can also be used with any system that can take advantage of a single digital signal that indicates whether the light is above or below levels of interest.

The interrupt event conditions are controlled by the high-limit and low-limit registers, as well as the configuration register latch and fault count fields. The results of comparing the result register with the high-limit register and low-limit register are referred to as fault events. The fault count register dictates how many consecutive same-result fault events are required to trigger an interrupt event and subsequently change the state of the interrupt reporting mechanisms, which are the INT pin, the flag high field, and the flag low field. The latch field allows a choice between a latched window-style comparison and a transparent hysteresis-style comparison.

The INT pin has an open-drain output, which requires the use of a pull-up resistor. This open-drain output allows multiple devices with open-drain INT pins to be connected to the same line, thus creating a logical NOR or AND function between the devices. The polarity of the INT pin can be controlled with the polarity of interrupt field in the configuration register. When the POL field is set to 0, the pin operates in an active low behavior that pulls the pin low when the INT pin becomes active. When the POL field is set to 1, the pin operates in an active high behavior and becomes high impedance, thus allowing the pin to go high when the INT pin becomes active.

Additional details of the interrupt reporting registers are described in the Interrupt Reporting Mechanism Modes and Internal Registers sections.