The following procedures are used to
configure a measurement evaluation with an electronic load. For the following
instructions, x = A to D for the A1 to A4 gain variants, respectively.
- According to Figure 4-1, for a low-side measurement, connect the electronic load positive input
terminal to the positive terminal of a ≥ 20-A capable hot-supply. For a
high-side measurement, connect the electronic load positive input terminal to
the load sourcing terminal (IS+ or IS–) of the EVM. For high-side measurement of
forward current, IS– sources to the electronic load; for reverse current, IS+
sources to the load. Reverse current can only be measured if VREF is set to a
potential higher than GND.
- Connect the electronic load negative output terminal to the external
hot supply GND terminal for high-side measurements, or to the load sinking
terminal of the EVM for low-side measurements.
- For high-side measurements, connect the external supply to the
load sinking terminal of the EVM. Otherwise, for low-side measurements, connect
the load sourcing terminal of the EVM (IS+ or IS–) to the external supply
GND.
- Turn on all the connected supplies.
- Apply load with electronic load.
- Measure the output voltage at the
VOUT test point.
Note:
The output voltage is equal to the
gain of the device multiplied by the load current passing through the leadframe
of the DUT.