SCAS294P January   1993  – May 2024 SN54LVC257A , SN74LVC257A

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Pin Configuration and Functions
  6. Specifications
    1. 5.1 Absolute Maximum Ratings
    2. 5.2 ESD Ratings
    3. 5.3 Recommended Operating Conditions
    4. 5.4 Thermal Information
    5. 5.5 Electrical Characteristics
    6. 5.6 Switching Characteristics, SN54LVC257A
    7. 5.7 Switching Characteristics, SN74LVC257A
    8. 5.8 Operating Characteristics
    9. 5.9 Typical Characteristics
  7. Parameter Measurement Information
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
    4. 7.4 Device Functional Modes
  9.   Application and Implementation
    1. 8.1 Application Information
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curves
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 8.1 Documentation Support (Analog)
      1. 8.1.1 Related Documentation
      2. 8.1.2 Related Links
    2. 8.2 Community Resources
    3. 8.3 Receiving Notification of Documentation Updates
    4. 8.4 Support Resources
    5. 8.5 Trademarks
    6. 8.6 Electrostatic Discharge Caution
    7. 8.7 Glossary
  11. Revision History
  12. 10Mechanical, Packaging, and Orderable Information

Features

  • Operate from 1.65V to 3.6V
  • Inputs accept voltages to 5.5V
  • Maximum tpd of 4.6ns at 3.3V
  • Typical VOLP (output ground bounce)
    <0.8V at VCC = 3.3V, TA = 25°C
  • Typical VOHV (output VOH undershoot)
    >2V at VCC = 3.3V, TA = 25°C
  • Latch-up performance exceeds 250mA per JESD 17
  • ESD protection exceeds JESD 22
    • 2000V human-body model (A114-A)
    • 200V machine model (A115-A)
  • On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.