SCHS208E February   1998  – July 2024 CD54HC4066 , CD74HC4066 , CD74HCT4066

PRODUCTION DATA  

  1.   1
  2. 1 Features
  3. 2 Applications
  4. 3 Description
  5. 4 Pin Configuration and Functions
  6. 5 Absolute Maximum Ratings
  7. 6 ESD Ratings
  8. 7 Thermal Information
  9. 8 Recommended Operating Conditions
  10. 9 Electrical Characteristics: HC Devices
  11. 10Electrical Characteristics: HCT Devices
  12. 11Switching Characteristics HC
  13. 12Switching Characteristics HCT
  14. 13Analog Channel Specifications
  15. 14Analog Test Circuits
  16. 15Test Circuits and Waveforms
  17. 16Detailed Description
    1. 16.1 Functional Block Diagram
    2. 16.2 Device Functional Modes
  18. 17Device and Documentation Support
    1. 17.1 Receiving Notification of Documentation Updates
    2. 17.2 Support Resources
    3. 17.3 Trademarks
    4. 17.4 Electrostatic Discharge Caution
    5. 17.5 Glossary
  19. 18Revision History
  20. 19Mechanical, Packaging, and Orderable Information

17.4 Electrostatic Discharge Caution

CD54HC4066 CD74HC4066 CD74HCT4066 This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.