SCHS371H November   2009  – October 2024 CDC3RL02

PRODUCTION DATA  

  1.   1
  2. Features
  3. Applications
  4. Description
  5. Device Comparison
  6. Pin Configuration and Functions
  7. Specifications
    1. 6.1 Absolute Maximum Ratings
    2. 6.2 ESD Ratings
    3. 6.3 Recommended Operating Conditions
    4. 6.4 Thermal Information
    5. 6.5 Electrical Characteristics
    6. 6.6 Typical Characteristics
  8. Detailed Description
    1. 7.1 Overview
    2. 7.2 Functional Block Diagram
    3. 7.3 Feature Description
      1. 7.3.1 Low Additive Noise
      2. 7.3.2 Regulated 1.8V Externally Available I/O Supply
      3. 7.3.3 Ultra-Small 8-bump YFP 0.4mm Pitch WCSP Package
    4. 7.4 Device Functional Modes
  9. Application and Implementation
    1. 8.1 Application Information
      1. 8.1.1 Input Clock Squarer
      2. 8.1.2 Output Stage
      3. 8.1.3 LDO
    2. 8.2 Typical Application
      1. 8.2.1 Design Requirements
      2. 8.2.2 Detailed Design Procedure
      3. 8.2.3 Application Curve
    3. 8.3 Power Supply Recommendations
    4. 8.4 Layout
      1. 8.4.1 Layout Guidelines
      2. 8.4.2 Layout Example
  10. Device and Documentation Support
    1. 9.1 Documentation Support
      1. 9.1.1 Related Documentation
    2. 9.2 Receiving Notification of Documentation Updates
    3. 9.3 Support Resources
    4. 9.4 Trademarks
    5. 9.5 Electrostatic Discharge Caution
    6. 9.6 Glossary
  11. 10Revision History
  12. 11Mechanical, Packaging, and Orderable Information

Recommended Operating Conditions

See (1)
MINMAXUNIT
VBATTInput voltage to internal LDO2.35.5V
VIInput voltageMCLK_IN, CLK_REQ1/201.89V
VOOutput voltageCLK_OUT1/201.8V
VIHHigh-level input voltageCLK_REQ1/21.31.89V
VILLow-level input voltageCLK_REQ1/200.5V
IOHHigh-level output current, DC current–8mA
IOLLow-level output current, DC current8mA
All unused inputs of the device must be held at VCC or GND to verify proper device operation. See the Implications of Slow or Floating CMOS Inputs application note.