The SN54SC2T74-SEP is packaged in a space enhanced plastic package for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm2/mg, which makes the device an option for low Earth orbit space applications. Single Event Transient (SET) data is also provided in the Single Event Effects Radiation Report.
All trademarks are the property of their respective owners.
The SN54SC2T74-SEP contains two independent D-type positive-edge-triggered flip-flops. The input is designed with a lower threshold circuit to support up translation for lower voltage CMOS inputs (for example, 1.2-V input to 1.8-V output or 1.8-V input to 3.3-V output.) Additionally, the 5-V tolerant input pins enable down translation (for example, 3.3-V to 2.5-V output). The SN54SC2T74-SEP is a pure CMOS device and therefore was tested at a High Dose Rate (HDR) for TID testing.