SCLK040 December   2023 SN54SC4T32-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data

2.4 Test Configuration and Condition

The RLAT units were irradiated to 30 krad(Si), parametrically tested on ATE, and then were annealed at 25ºC anneal for 50 hours. The units were then put through parametric testing once more on the ATE. An additional 6 units were irradiated to 30 krad(Si) without anneal, for reference.

Table 2-1 lists the serialized samples used for TID Radiation Lot Acceptance Testing (RLAT).

Table 2-1 HDR Device Information
Control GroupHDR = 197.93 rad(Si)/s
Total Samples: 4Total Samples: 12
Exposure Levels
0 krad (Si)30 krad(Si)
BiasedBiasedBiased + 50 hour anneal
1 - 45 - 1011 - 16