This report discusses the radiation characterization results of
the SN54SC6T06-SEP radiation tolerant, hex inverter buffers and drivers with
open-drain outputs. The study was done to determine Total Ionizing Dose (TID)
effects under high dose rate (HDR) to 30krad(Si). Radiation Lot Acceptance Testing
(RLAT) was performed using five units at a dose level of 30krad(Si) per MIL-STD-883
TM 1019. All future wafer lots will be tested under the same conditions.
The SN54SC6T06-SEP is packaged in
a space enhanced plastic for low outgassing characteristics and is Single Event
Latch-Up (SEL) immune up to 43MeV-cm2 / mg, which makes the device an
option for low Earth orbit space applications.
For full total ionizing dose
characterization results, see SN54SC6T07-SEP Total Ionizing
Dose (TID) Report.