SCLK050 February   2024 SN54SC6T17-SEP

PRODUCTION DATA  

  1.   1
  2.   Abstract
  3.   Trademarks
  4. 1Device Information
    1. 1.1 Device Details
  5. 2Total Dose Test Setup
    1. 2.1 Test Overview
    2. 2.2 Test Description and Facilities
    3. 2.3 Test Setup Details
      1. 2.3.1 Bias Diagram
    4. 2.4 Test Configuration and Condition
  6. 3TID Characterization Test Results
    1. 3.1 TID Characterization Summary Results
    2. 3.2 Specification Compliance Matrix
  7. 4Reference Documents
  8. 5Appendix: HDR TID Report Data

1.1 Device Details

Table 1-1 lists the device information used for TID HDR characterization and qualification.

Table 1-1 Device and Exposure Details
TID HDR Details: up to 30krad(Si)
TI Device NumberSN54SC6T17-SEP
Package14-pin PW (TSSOP)
TechnologyLBC9
Die Lot Number2208586RFB
A/T Lot Number and Date Code3273122ML3 / 33AHEFK
Quantity Tested12 irradiated devices + four control
Lot Accept or RejectDevices passed 30krad(Si)
HDR Radiation FacilityTexas Instruments CLAB in Dallas, Texas
HDR Dose Level10 krad(Si), 20 krad(Si), 30 krad(Si), 50 krad(Si)
HDR Dose Rate191.54rad(Si)/s ionizing radiation
HDR Radiation SourceGammacell 220 Excel (GC-220E) Co-60
Irradiation TemperatureAmbient, room temperature