SFFS034A July 2021 – July 2021 TPS1H000-Q1
The failure mode distribution estimation for TPS1H000-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT stuck open (HiZ) | 20% |
| VOUT stuck on (VS) | 10% |
| VOUT functional, not in specification voltage or timing | 45% |
| Diagnostics not in specification | 10% |
| Protection function fails to trip | 10% |
| Pin to Pin short any two pins | 5% |