SFFS095 April 2021 ISO6731 , ISO6731-Q1
4.1 16-DW (wide-body SOIC) Package
Figure 4-1 shows the ISO6731/ISO6731-Q1 and ISO6731F/ISO6731F-Q1 pin diagram for the 16-DW package. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the ISO6731/ISO6731-Q1 data sheet.
Figure 4-1 Pin Diagram (16-DW) PackageTable 4-2 Pin FMA for Device Pins
Short-Circuited to Ground
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. OUTC state undetermined. | A |
| GND1 | 2 | Device continues to function as expected.Normal operation. | D |
| INA | 3 | Input signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted. | B |
| INB | 4 | Input signal shorted to ground, so output (OUTB) stuck to low. Communication from INB to OUTB corrupted. | B |
| OUTC | 5 | OUTC stuck low. Data communication from INC to OUTC lost. Device damage possible if INC is driven high for extended period of time. | A |
| NC | 6 | Device continues to function as expected. Normal operation. | D |
| EN1 | 7 | Disables output buffer for OUTC. Communication corrupted for Channel C. | B |
| GND1 | 8 | Device continues to function as expected. Normal operation. | D |
| GND2 | 9 | Device continues to function as expected. Normal operation. | D |
| EN2 | 10 | Disables the output buffer for OUTA/OUTB channels. Communication corrupted. | B |
| NC | 11 | Device continues to function as expected. Normal operation. | D |
| INC | 12 | Input signal shorted to ground, so output (OUTC) stuck to low. Communication from INC to OUTC corrupted. | B |
| OUTB | 13 | OUTB stuck low. Data communication from INB to OUTB lost. Device damage possible if INB is driven high for extended period of time. | A |
| OUTA | 14 | OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time. | A |
| GND2 | 15 | Device continues to function as expected. Normal operation. | D |
| VCC2 | 16 | No power to the device on side-2. OUTA/OUTB pins state undetermined. | B |
Table 4-3 Pin FMA for Device Pins
Open-Circuited
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | Operation undetermined. Either device is unpowered and OUTA/OUTB=default logic state, OUTC=undetermined or through internal ESD diode on INA/INB pin, device can power up if any IN is driven to logic high. If IN has current sourcing capability to provide regular operating current of device, ESD diode conducts that current and device damage plausible. | A |
| GND1 | 2 | Device gets return ground through pin8. Normal operation. | D |
| INA | 3 | No communication to INA channel possible. OUTA stuck to default state (High for ISO6731/ISO6731-Q1 and Low for ISO6731F/ISO6731F-Q1). | B |
| INB | 4 | No communication to INB channel possible. OUTB stuck to default state (High for ISO6731/ISO6731-Q1 and Low for ISO6731F/ISO6731F-Q1). | B |
| OUTC | 5 | State of OUTC undetermined. Data communication from INC to OUTC lost. | B |
| NC | 6 | Device continues to function as expected. Normal operation. | D |
| EN1 | 7 | Control on OUTC output buffer lost, but communication from IN to OUT channels continues normally. | B |
| GND1 | 8 | Device gets return ground through pin2. Normal operation. | D |
| GND2 | 9 | Device gets return ground through pin15. Normal operation. | D |
| EN2 | 10 | Control on OUTA/OUTB output buffer lost, but communication from IN to OUT channels continues normally. | B |
| NC | 11 | Device continues to function as expected. Normal operation. | D |
| INC | 12 | No communication to INC channel possible. OUTC stuck to default state (High for ISO6731/ISO6731-Q1 and Low for ISO6731F/ISO6731F-Q1). | B |
| OUTB | 13 | State of OUTB undetermined. Data communication from INB to OUTB lost. | B |
| OUTA | 14 | State of OUTA undetermined. Data communication from INA to OUTA lost. | B |
| GND2 | 15 | Device gets return ground through pin9. Normal operation. | D |
| VCC2 | 16 | Device unpowered on side-2 and state of OUTA/OUTB undetermined. | B |
Table 4-4 Pin FMA for Device Pins
Short-Circuited to Adjacent Pin
| Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|---|
| VCC1 | 1 | GND1 | No power to the device on side-1. Observe that the absolute maximum ratings for all pins of the device are met; otherwise device damage may be plausible. | A |
| GND1 | 2 | INA | Input signal shorted to ground, so output (OUTA) stuck to low. Communication from INA to OUTA corrupted. | B |
| INA | 3 | INB | Communication corrupted for either INA or INB channel. | B |
| INB | 4 | OUTC | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | A |
| OUTC | 5 | NC | Device continues to function as expected. Normal operation. | D |
| NC | 6 | EN1 | Device continues to function as expected. Normal operation. | D |
| EN1 | 7 | GND1 | Disables OUTC output buffer. Communication for channel C corrupted. | B |
| GND1 | 8 | EN1 | Already considered in above row. | B |
| GND2 | 9 | EN2 | Disables the output buffer for all OUTA/OUTB Output channels. Communication corrupted. | B |
| EN2 | 10 | NC | Device continues to function as expected. Normal operation. | D |
| NC | 11 | INC | Device continues to function as expected. Normal operation. | D |
| INC | 12 | OUTB | Communication corrupted for either or both channels. With opposite logic state on both channels, high current can flow between supply and ground and cause possible device damage. | B |
| OUTB | 13 | OUTA | Communication corrupted for either OUTA or OUTB channel. Device damage possible if INA and INB try to drive opposite logic state for extended duration creating a short between supply and ground on side-2. | A |
| OUTA | 14 | GND2 | OUTA stuck low. Data communication from INA to OUTA lost. Device damage possible if INA is driven high for extended period of time. | A |
| GND2 | 15 | VCC2 | No power to the device on side-2. OUTA/OUTB pins state undetermined. | B |
| VCC2 | 16 | GND2 | Already considered in above row. | B |
Table 4-5 Pin FMA for Device Pins Short-Circuited to
supply
| Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
|---|---|---|---|
| VCC1 | 1 | No effect. Normal operation. | D |
| GND1 | 2 | This can create potential difference between pin2 and pin8, causing high current to flow in device and potential device damage. | A |
| INA | 3 | INA pin stuck high. Communication corrupted. OUTA state high. | B |
| INB | 4 | INB pin stuck high. Communication corrupted. OUTB state high. | B |
| OUTC | 5 | OUTC stuck high. Data communication from INC to OUTC lost. Device damage possible if INC is driven high for extended period of time. | A |
| NC | 6 | Device continues to function as expected. Normal operation. | D |
| EN1 | 7 | Functionality to disable output buffer OUTC lost. Communication for all channels normal. | B |
| GND1 | 8 | This can create potential difference between pin2 and pin8, causing high current to flow in device and potential device damage. | A |
| GND2 | 9 | This can create potential difference between pin9 and pin15, causing high current to flow in device and potential device damage. | A |
| EN2 | 10 | Functionality to disable output buffer for OUTA/OUTB lost. Communication for all channels normal. | B |
| NC | 11 | Device continues to function as expected. Normal operation. | D |
| INC | 12 | INC pin stuck high. Communication corrupted. OUTC state high. | B |
| OUTB | 13 | OUTB stuck high. Communication disrupted. If INB is low for extended duration, OUTB being stuck high creates a short and can damage the device. | A |
| OUTA | 14 | OUTA stuck high. Communication disrupted. If INA is low for extended duration, OUTA being stuck high creates a short and can damage the device. | A |
| GND2 | 15 | This can create potential difference between pin9 and pin15, causing high current to flow in device and potential device damage. | A |
| VCC2 | 16 | Device continues to function as expected. Normal operation. | D |