SFFS098 April   2021 ISO6742 , ISO6742-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 16-SOIC (wide-body SOIC) Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 16-DW (wide-body SOIC) Package

1 Overview

This document contains information for ISO6742/ISO6742-Q1 and ISO6742F/ISO6742F-Q1 (16-DW package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 shows the functional block diagram of one channel of ISO6742/ISO6742-Q1 and ISO6742F/ISO6742F-Q1 for reference.

GUID-A3DB3F6B-8902-47DF-8BA2-201A2DDF102D-low.gifFigure 1-1 Functional Block Diagram

ISO6742/ISO6742-Q1 and ISO6742F/ISO6742F-Q1 were developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.