4 Pin Failure Mode Analysis (Pin FMA)

This section provides a Failure Mode Analysis (FMA) for the pins of the TCAN11623-Q1 and TCAN11625-Q1 (DMT package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:

• Pin short-circuited to Ground (see Table 4-2 and Table 4-8.)
• Pin open-circuited (seeTable 4-3 and Table 4-9)
• Pin short-circuited to an adjacent pin (see Table 4-4 and Table 4-10)
• Pin short-circuited to V_SUP supply (see Table 4-5 and Table 4-11)
• Pin short-circuited to V_CCOUT supply (see Table 4-12)
• Pin short-circuited to V_LDO3 supply (see Table 4-6)
• Pin short-circuited to V_IO supply (see Table 4-7 and Table 4-13)

Table 4-2 through Table 4-11 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

• All conditions are within recommended operating conditions
• VSUP = see recommended conditions in device datasheet
• VIO = 1.7 to 5.5 V