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This document contains information for TPSI2140-Q1 (11 DWQ package) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the functional block diagram of TPSI2140-Q1 for reference.
TPSI2140-Q1 was developed using a quality-managed development process, but was not developed in accordance with IEC 61508 or ISO 26262 standards.
ADVANCE INFORMATION for preproduction products; subject to change without notice.
This section provides Functional Safety Failure In Time (FIT) rates for the TPSI2140-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 22 |
Die FIT Rate | 4 |
Package FIT Rate | 18 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS, BICMOS Digital, analog / mixed | 30 FIT | 75°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.