SFFS203 September 2022 TLV1812 , TLV1822
This section provides Functional Safety Failure In Time (FIT) rates for TLV1812 and TLV1822 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per
109 Hours) For SOIC (8) Package |
---|---|
Total Component FIT Rate5 |
10 |
Die FIT Rate | 3 |
Package FIT Rate |
7 |
The failure rate and mission profile information in Table 2-1 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
4 | CMOS, BICMOS Digital, analog / mixed | 12 | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.