SFFS243 august 2021 DRV8143-Q1
Figure 4-4shows the pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the DRV8143-Q1 data sheet.
Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
---|---|---|---|
No. | Name | ||
1 | nFAULT | False fault signalling. Devie will continue to operate as commanded. | B |
2 | IPROPI | IPROPI feedback is lost. ITRIP regulation, if enabled, is also lost. | B |
3 | nSLEEP | Device will be in SLEEP state and outputs are Hi-Z | B |
4 | VM | Device is powered off with driver Hi-Z. | B |
5 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
6 | GND | Normal function. | D |
7 | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
8 | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
9 | DRVOFF | Shutoff function is lost. | B |
10 | IN | External PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
11 | DIAG | Wrong load and fault response configuration possible. | B |
12 | SR | Wrong SR configuration possible, EM performance may be affected. | B |
13 | ITRIP | Incorrect ITRIP level for current regulation possible. | B |
14 | NC | Unused pin. | D |
Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
---|---|---|---|
No. | Name | ||
1 | nFAULT | False fault signalling. Devie will continue to operate as commanded. | B |
2 | IPROPI | IPROPI feedback is lost. Load will be forced to recirculte if ITRIP regulation is enabled. | B |
3 | nSLEEP | Device will be in SLEEP state and outputs are Hi-Z | B |
4 | VM | Device is powered off with driver Hi-Z. | B |
5 | OUT | Load drive capability is lost. | B |
6 | GND | Normal function. | D |
7 | OUT | Load drive capability is lost. | B |
8 | VCP | The driver can't keep up with PWM frequency > 20 KHz. | B |
9 | DRVOFF | Pin based shutoff is triggered and OUT is Hi-Z. | B |
10 | IN | External PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
11 | DIAG | Wrong load and fault response configuration possible. | B |
12 | SR | Wrong SR configuration possible, EM performance may be affected. | B |
13 | ITRIP | Incorrect ITRIP level for current regulation possible. | B |
14 | NC | Not used. | D |
Short between pins | Description of Potential Failure Effect(s) | Failure Effect Class | |
---|---|---|---|
nFAULT | NC | Fault signaling function is unaffected. | D |
IPROPI | nFAULT | False fault signaling possible. IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
nSLEEP | IPROPI | IPROPI feedback is inaccurate. ITRIP regulation levels, if enabled, will be lower. | B |
VM | nSLEEP | SLEEP functionality is lost. | B |
OUT | VM | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
GND | OUT | If OUT is commanded to be pulled high, short is detected and OUT is Hi-Z. | B |
VCP | VM | Pull up path RON (High-side FET) will be much higher. | B |
DRVOFF | VCP | Device damage possible. Device behavior can not be guaranteed. | A |
IN | DRVOFF | Either OUT is Hi-Z or external PWM control is lost. Internal ITRIP regulation is ok. No risk of spin direction reversal. | B |
DIAG | IN | Wrong load and fault response configuration possible. Internal ITRIP regulation is OK. No risk of spin direction reversal. | B |
SR | DIAG | Wrong configuration - EM performance may be affected. Load and fault response may be incorrect. | B |
ITRIP | SR | Wrong configuration - EM performance may be affected. Incorrect ITRIP level for current regulation possible. | B |
NC | ITRIP | ITRIP setting is unaffected. | D |
Pin | Description of Potential Failure Effect(s) | Failure Effect Class | |
---|---|---|---|
No. | Name | ||
1 | nFAULT | Device damage possible. | A |
2 | IPROPI | Device damage possible. | A |
3 | nSLEEP | SLEEP functionality is lost. | B |
4 | VM | Normal function. | D |
5 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
6 | GND | Normal function. | D |
7 | OUT | If OUT is commanded to be pulled low, short is detected and OUT is Hi-Z. | B |
8 | VCP | Pull up path RON (High-side FET) will be much higher. | B |
9 | DRVOFF | OUT is Hi-Z. | B |
10 | IN | Device damage possible. | A |
11 | DIAG | Device damage possible. | A |
12 | SR | Device damage possible. | A |
13 | ITRIP | Device damage possible. | A |
14 | NC | Device damage possible. | A |