SFFS286 September 2021 TLVH431B-Q1
This section provides Functional Safety Failure In Time (FIT) rates for TLVH431B-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 5 |
Die FIT Rate | 3 |
Package FIT Rate | 2 |
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 4 |
Die FIT Rate | 3 |
Package FIT Rate | 1 |
The failure rate and mission profile information in Table 2-1 and Table 2-2 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
TABLE | CATEGORY | REFERENCE FIT RATE | REFERENCE VIRTUAL TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog / mixed | 20 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-3 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.