SFFS315 September   2022 TPS7B86-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
    1. 2.1 TO-252 Package
    2. 2.2 HSOIC Package
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)
    1. 4.1 TO-252 Package
    2. 4.2 HSOIC Package
    3. 4.3 HSOIC Package B Version
    4. 4.4 HSOIC Package D Version

1 Overview

This document contains information for the TPS7B86-Q1 (TO-252 and HSOIC packages) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

Figure 1-1 shows the device functional block diagram for a fixed output without PG for reference.

Figure 1-2 shows the device functional block diagram for an adjustable output without PG for reference

Figure 1-3 shows the device functional block diagram for a fixed output with PG for reference

GUID-16D4A013-B77A-4AEA-8898-073CDAB8E928-low.gif Figure 1-1 TPS7B86-Q1 Fixed Output Without PG
GUID-46B9FB9F-6DEB-4FE6-88D4-9E3923C69D90-low.gif Figure 1-2 TPS7B86-Q1 Adjustable Output Without PG
Figure 1-3 TPS7B86-Q1 With PG

The TPS7B86-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.