This document contains information for LM5148-Q1 (VQFN package)
to aid in a functional safety system design. Information provided are:
- Functional Safety Failure In Time (FIT)
rates of the semiconductor component estimated by the application of industry reliability
standards
- Component failure modes and their
distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (Pin FMA)
#GUID-E488EBD4-511E-41B0-B770-91A9719CA4DD shows the device functional block diagram for reference.
Figure 1-1 Functional Block Diagram
LM5148-Q1 was developed using a quality-managed
development process, but was not developed in accordance with the IEC 61508 or ISO 26262
standards.