SFFS399 March 2022 TPS3760
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS3760. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TPS3760 pin diagram. For a detailed description of the device pins please refer to TPS3760 in the Pin Configuration and Functions section of the data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 |
VDD short to GND, Device has no power for normal operation |
B |
NC |
2 | Normal operation, Pin is not connected during normal operation | D |
SENSE | 3 | Functionality affected, Voltage threshold will not be intended threshold | B |
NC | 4 | Normal operation, Pin is not connected during normal operation | D |
NC | 5 | Normal operation, Pin is not connected during normal operation | D |
RESET |
6 | Functionality affected, Unreliable device output | A |
NC |
7 | Normal operation, Pin is not connected during normal operation | D |
GND | 8 | Normal operation | D |
CTR | 9 | RESET will be asserted. | B |
CTS | 10 | Normal operation, RESET will be asserted | B |
NC |
11 |
Normal operation, Pin is not connected during normal operation | D |
NC |
12 |
Normal operation, Pin is not connected during normal operation | D |
GND |
13 |
Normal operation | D |
NC |
14 |
Normal operation, Pin is not connected during normal operation | D |
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | Device Unpowered | B |
NC |
2 | Normal operation, Pin is not connected during normal operation | D |
SENSE | 3 | Functionality affected, Voltage threshold will not be intended threshold | B |
NC | 4 | Normal operation, Pin is not connected during normal operation | D |
NC | 5 | Normal operation, Pin is not connected during normal operation | D |
RESET |
6 | Functionality affected, Unreliable device output | A |
NC |
7 | Normal operation, Pin is not connected during normal operation | D |
GND | 8 | Device Unpowered | B |
CTR | 9 | Normal operation | D |
CTS | 10 | Normal operation | D |
NC |
11 |
Normal operation, Pin is not connected during normal operation | D |
NC |
12 |
Normal operation, Pin is not connected during normal operation | D |
GND |
13 |
Device Unpowered | B |
NC |
14 |
Normal operation, Pin is not connected during normal operation | D |
PIN NAME | PIN NO. | SHORTED TO | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|---|
VDD | 1 |
NC |
Normal operation | D |
NC |
2 | SENSE | Normal operation | D |
SENSE | 3 | NC | Normal operation | D |
NC | 4 | NC | Normal operation | D |
NC | 5 |
RESET |
Normal operation | D |
RESET |
6 |
NC |
Functionality affected, Unreliable device output. NC is not connected during normal operation. | B |
NC |
7 | GND | Normal operation | D |
GND | 8 | CTR | Functionality affected, RESET is asserted | B |
CTR | 9 | CTS | Functionality affected, Iq can increase | B |
CTS | 10 | NC | Functionality affected, Iq can increase | B |
NC |
11 |
NC | Functionality affected, Iq can increase | C |
NC |
12 |
GND | Functionality affected, Iq can increase | C |
GND |
13 |
NC |
Normal operation | D |
NC |
14 |
VDD | Normal operation | D |
PIN NAME | PIN NO. | DESCRIPTION OF POTENTIAL FAILURE EFFECT(S) | FAILURE EFFECT CLASS |
---|---|---|---|
VDD | 1 | Normal operation | D |
NC |
2 | Normal operation | D |
SENSE | 3 | Functionality affected, Voltage threshold will not be intended threshold | B |
NC | 4 | Normal operation | D |
NC | 5 | Normal operation | D |
RESET |
6 | Functionality affected, Can cause short from VDD to GND | A |
NC |
7 | Functionality affected, Can cause short from VDD to GND | A |
GND | 8 | VDD short to GND Fault | B |
CTR | 9 | May damage device if VDD is greater than the pin's recommended operating condition | A |
CTS | 10 | May damage device if VDD is greater than the pin's recommended operating condition | A |
NC |
11 |
May damage device if VDD is greater than the pin's recommended operating condition | A |
NC |
12 |
May damage device if VDD is greater than the pin's recommended operating condition | A |
GND |
13 |
VDD short to GND Fault | B |
NC |
14 |
Normal operation | D |