SFFS408 may 2023 TLV9022-Q1 , TLV9024-Q1 , TLV9032-Q1 , TLV9034-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TLV9044-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1 .
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 4-1 shows the TLV9044-Q1 pin diagram. For a detailed description of the device pins please refer to the 'Pin Configuration and Functions' section in the data sheet.
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT2 |
1 |
No change if GND pin is GND node | B |
OUT1 |
2 |
No change if GND pin is GND node | B |
V+ |
3 |
Main supply shorted out (no power to device) | B |
IN1- |
4 |
Output goes high, if other input is positive | B |
IN1+ |
5 |
Output goes low, if other input is positive | B |
IN2- |
6 |
Output goes high, if other input is positive | B |
IN2+ |
7 |
Output goes low, if other input is positive | B |
IN3- |
8 |
Output goes high, if other input is positive | B |
IN3+ |
9 |
Output goes low, if other input is positive | B |
IN4- |
10 |
Output goes high, if other input is positive | B |
IN4+ |
11 |
Output goes low, if other input is positive | B |
V- |
12 |
No change if same node as GND | D |
OUT4 |
13 |
No change if GND pin is GND node | B |
OUT3 |
14 |
No change if GND pin is GND node | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT2 | 1 | Output can't drive application load | B |
OUT1 | 2 | Output can't drive application load | B |
V+ | 3 | Main supply open (no power to device) | B |
IN1- | 4 | Output can be low or high | B |
IN1+ | 5 | Output can be low or high | B |
IN1- | 6 | Output can be low or high | B |
IN2+ | 7 | Output can be low or high | B |
IN3- | 8 | Output can be low or high | B |
IN3+ | 9 | Output can be low or high | B |
IN4- | 10 | Output can be low or high | B |
IN4+ | 11 | Output can be low or high | B |
V- | 12 | Lowest voltage pin drives GND pin internally (via diode) | A |
OUT4 | 13 | Output can't drive application load | B |
OUT3 | 14 | Output can't drive application load | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
OUT2 | 1 | OUT1 | Output can be low or high | B |
OUT1 | 2 | V+ | Thermal stress due to high power dissipation | A |
V+ | 3 | IN1- | Output goes low, if other input is less positive | B |
IN1- | 4 | IN1+ | Output can be low or high | B |
IN1+ | 5 | IN2- | Output can be low or high | B |
IN2- | 6 | IN2+ | Output can be low or high | B |
IN2+ | 7 | IN3- | Output can be low or high | B |
IN3- | 8 | IN3+ | Output can be low or high | B |
IN3+ | 9 | IN4- | Output can be low or high | B |
IN4- | 10 | IN4+ | Output can be low or high | B |
IN4+ | 11 | V- | Output goes low, if other input is positive | B |
V- | 12 | OUT4 | No change if GND pin is GND node | B |
OUT4 | 13 | OUT3 | Output can be low or high | B |
OUT3 | 14 | OUT2 | Output can be low or high | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT2 |
1 |
Thermal stress due to high power dissipation | A |
OUT1 |
2 |
Thermal stress due to high power dissipation | A |
V+ |
3 |
No change if same node as VCC | D |
IN1- |
4 |
Output goes low, if other input is less positive | B |
IN1+ |
5 |
Output goes high, if other input is less positive | B |
IN2- |
6 |
Output goes low, if other input is less positive | B |
IN2+ |
7 |
Output goes high, if other input is less positive | B |
IN3- |
8 |
Output goes low, if other input is less positive | B |
IN3+ |
9 |
Output goes high, if other input is less positive | B |
IN4- |
10 |
Output goes low, if other input is less positive | B |
IN4+ |
11 |
Output goes high, if other input is less positive | B |
V- |
12 |
Main supply shorted out (no power to device) | B |
OUT4 |
13 |
Thermal stress due to high power dissipation | A |
OUT3 |
14 |
Thermal stress due to high power dissipation | A |