SFFS424 June 2022 TCAN1462-Q1
This section provides Functional Safety Failure In Time (FIT) rates for TCAN1462-Q1 and TCAN1462V-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) | FIT (Failures Per 109 Hours) 8-pin SOT (DDF) |
---|---|---|---|
Total Component FIT Rate | 10 | 7 | 5 |
Die FIT Rate | 3 | 3 | 3 |
Package FIT Rate | 7 | 4 | 2 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog & Mixed =<50V supply | 25 FIT | 55C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.