SFFS442 March 2022 TPS62090-Q1
This section provides a Failure Mode Analysis (FMA) for the pins of the TPS62090-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 2-2 through Table 2-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 2-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Figure 2-1 shows the TPS62090-Q1 pin diagram. For a detailed description of the device pins please refer to the Pin Configuration and Functions section in the TPS62090-Q1 data sheet.
The following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class SW |
---|---|---|---|
SW | 1 | Potential device damage | A |
SW | 2 | Potential device damage | A |
FREQ | 3 | Intended functionality. The device operates in 2.8-MHz switching frequency. | D |
PG | 4 | No operation and no power-good indication | D |
FB | 5 | Incorrect device functionality due to missing feedback path | B |
AGND | 6 | No effect and normal operation | D |
CP | 7 | Potential device damage | A |
CN | 8 | Potential device damage | A |
SS | 9 | Incorrect device functionality and the device does not start up | B |
AVIN | 10 | Potential device damage | A |
PVIN | 11 | Potential device damage | A |
PVIN | 12 | Potential device damage | A |
EN | 13 | The converter is disabled and there is no output voltage on the converter. | D |
PGND | 14 | No effect and normal operation | D |
PGND | 15 | No effect and normal operation | D |
VOS | 16 | Affects the device functionality like transient performance, output discharge, and current limit | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
SW | 1 | Potential device damage | A |
SW | 2 | Potential device damage | A |
FREQ | 3 | Intended functionality and the device operates in 2.8-MHz switching frequency through internal pulldown. | C |
PG | 4 | Intended functionality | B |
FB | 5 | Undetermined output voltage behavior of converter and open loop operation | B |
AGND | 6 | The device does not power up and there is no output voltage. | B |
CP | 7 | Undetermined device operation | B |
CN | 8 | Undetermined device operation | B |
SS | 9 | Intended operation. The pin sets the soft-start time to 50 μs (typical). | D |
AVIN | 10 | The device does not power up and there is no output voltage. | A |
PVIN | 11 | The device does not power up and there is no output voltage. | A |
PVIN | 12 | The device does not power up and there is no output voltage. | A |
EN | 13 | The device is either enabled or disabled. If enabled, output voltage is regulated to its nominal value. If disabled, there is no output voltage | D |
PGND | 14 | The device does not power up and there is no output voltage. | B |
PGND | 15 | The device does not power up and there is no output voltage. | B |
VOS | 16 | Affects the device functionality like transient performance, output discharge, and current limit | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
SW | 1 | 2 | Intended functionality | D |
SW | 2 | 3 | Potential internal device damage | A |
FREQ | 3 | 4 | Potential internal device damage | A |
PG | 4 | 5 | Potential internal device damage | A |
FB | 5 | 6 | Potential internal device damage | A |
AGND | 6 | 7 | Incorrect functionality. Potential internal device damage | A |
CP | 7 | 8 | Potential internal device damage | A |
CN | 8 | 9 | Incorrect device functionality | B |
SS | 9 | 10 | Intended operation. The pin sets the soft-start time to 50 μs (typical). | B |
AVIN | 10 | 11 | Intended functionality | D |
PVIN | 11 | 12 | Intended functionality | D |
PVIN | 12 | 13 | Intended functionality | D |
EN | 13 | 14 | Intended operation. The device is disabled | D |
PGND | 14 | 15 | Intended functionality | D |
PGND | 15 | 16 | Output short to ground. The device is not functional. | B |
VOS | 16 | 1 | Incorrect device functionality | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
SW | 1 | Potential device damage | A |
SW | 2 | Potential device damage | A |
FREQ | 3 | Intended functionality, device operates in 1.4 MHz switching frequency | D |
PG | 4 | Potential device damage | A |
FB | 5 | Potential device damage | A |
AGND | 6 | Potential device damage | A |
CP | 7 | Potential impact on device reliability and potential internal device damage | A |
CN | 8 | Potential impact on device reliability and potential internal device damage | A |
SS | 9 | Intended operation. The pin sets the soft-start time to 50 μs (typical). | D |
AVIN | 10 | Normal operation | D |
PVIN | 11 | Normal operation | D |
PVIN | 12 | Normal operation | D |
EN | 13 | Normal operation | D |
PGND | 14 | Potential device damage | A |
PGND | 15 | Potential device damage | A |
VOS | 16 | Potential internal device damage | A |