SFFS468 august 2023 AMC3330-Q1
This section provides a failure mode analysis (FMA) for the pins of the AMC3330-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality. |
B | No device damage, but loss of functionality. |
C | No device damage, but performance degradation. |
D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the AMC3330-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the AMC3330-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DCDC_OUT | 1 | Signal chain on input side unpowered. Device outputs fail-safe state (see data sheet for details). Observe that the absolute maximum ratings for INP and INN of the device are met, otherwise device damage is plausible. | A |
DCDC_HGND | 2 | No effect. Normal operation. | D |
HLDO_IN | 3 | Signal chain on input side unpowered. Increased power consumption. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
NC | 4 | No effect. Pin has no internal connection. | D |
HLDO_OUT | 5 | Signal chain on input side unpowered. Increased power consumption. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
INP | 6 | INP stuck low (GND1). Differential output (VOUTP – VOUTN) = 0 V with common-mode voltage approximately 1.44 V (for the assumed use case). | C |
INN | 7 | INN stuck low (HGND). Differential output (VOUTP – VOUTN) = VINP × 0.4 with common-mode voltage approximately 1.44 V. Normal operation for the assumed use case. | D |
HGND | 8 | No effect. Normal operation. | D |
GND | 9 | No effect. Normal operation. | D |
OUTN | 10 | OUTN stuck low (GND). Excess current consumption from VDD source because of short-circuit condition. Long-term damage plausible. | A |
OUTP | 11 | OUTP stuck low (GND). Excess current consumption from VDD source because of short-circuit condition. Long-term damage plausible. | A |
VDD | 12 | Device is unpowered. OUTP and OUTN pins are driven to GND. | B |
LDO_OUT | 13 | DC/DC converter is unpowered. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
DIAG | 14 | DIAG stuck low (GND). Device operates normally but falsely indicates that high-side in non-operational (see data sheet for details). | B |
DCDC_GND | 15 | No effect. Normal operation. | D |
DCDC_IN | 16 | DC/DC converter converter is unpowered. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DCDC_OUT | 1 | Signal chain on input side unpowered. Device outputs fail-safe state (see data sheet for details). | B |
DCDC_HGND | 2 | DCDC_HGND internally connected to HGND through diode. Device outputs fail-safe state (see data sheet for details). | B |
HLDO_IN | 3 | Signal chain on input side unpowered. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
NC | 4 | No effect. Pin has no internal connection. | D |
HLDO_OUT | 5 | No decoupling cpacitor connected to the output of the high-side LDO. Device remains functional, parametric degradation is plausible. | C |
INP | 6 | Differential output (VOUTP – VOUTN) undetermined. | B |
INN | 7 | Differential output (VOUTP – VOUTN) undetermined. | B |
HGND | 8 | HGND internally connected to DCDC_HGND through diode. Device outputs fail-safe state (see data sheet for details). | B |
GND | 9 | GND internally connected to DCDC_GND through diode. Device remains functional but common-mode ouput voltage shifts up (out of specification). | C |
OUTN | 10 | Differential output (VOUTP – VOUTN) undetermined. | B |
OUTP | 11 | Differential output (VOUTP – VOUTN) undetermined. | B |
VDD | 12 | Device is unpowered. OUTP and OUTN pins are driven to GND. | B |
LDO_OUT | 13 | DC/DC converter is unpowered. Device outputs fail-safe state (see data sheet for details). | B |
DIAG | 14 | Pull-up resistor disconnected. No effect on primary function of the device. Diagnostic output not observable (see data sheet for details). | B |
DCDC_GND | 15 | DCDC_GND internally connected to GND through diode. Device outputs fail-safe state (see data sheet for details) with increased power consumption from VDD source. Long-term damage plausible. | A |
DCDC_IN | 16 | DC/DC converter is unpowered. Device outputs fail-safe state (see data sheet for details). | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
DCDC_OUT | 1 | DCDC_HGND | Signal chain on input side unpowered. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
DCDC_HGND | 2 | HLDO_IN | Signal chain on input side unpowered. Device outputs fail-safe state (see data sheet for details). Long-term damage plausible. | A |
HLDO_IN | 3 | NC | No effect. Pin 4 has no internal connection. | D |
NC | 4 | HLDO_OUT | No effect. Pin has no internal connection. | D |
HLDO_OUT | 5 | INP | INP stuck high (VHLDO_OUT). Differential output (VOUTP – VOUTN) = VCLIPout. See data sheet for details. | B |
INP | 6 | INN | Differential input shorted. Differential output (VOUTP – VOUTN) = 0 V. | B |
INN | 7 | HGND | INN stuck low (HGND). Differential output (VOUTP – VOUTN) = VINP × 0.4 with common-mode voltage approximately 1.44 V. Normal operation for the assumed use case. | D |
HGND | 8 | GND | Not considered. Corner pin. | N/A |
GND | 9 | OUTN | OUTN stuck low (GND2). Excess current consumption from VDD2 source because of short-circuit condition. Long-term damage plausible. | A |
OUTN | 10 | OUTP | Differential output (VOUTP – VOUTN) = 0 V with common-mode voltage of approximately 1.44 V. Excess current consumption from VDD source. Long-term damage plausible. | A |
OUTP | 11 | VDD | VOUTP stuck high (VDD). Excess current consumption from VDD source. Long-term damage plausible. | A |
VDD | 12 | LDO_OUT | DC/DC converter is supplied from VDD. Device functions normally with increased power consumption from VDD source. Long-term damage plausible. | A |
LDO_OUT | 13 | DIAG | DIAG stuck high (LDO_OUT). Device operates normally with excessive power dissipation if DIAG is driven low (e.g. during statup). Long-term damage plausible. | A |
DIAG | 14 | DCDC_GND | DIAG stuck low (GND). Device operates normally but falsely indicates that high-side in non-operational (see data sheet for details). | B |
DCDC_GND | 15 | DCDC_IN | DC/DC converter unpowered. Device outputs fail-safe state (see data sheet for details). | B |
DCDC_IN | 16 | DCDC_OUT | Not considered. Corner pin. | N/A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
DCDC_OUT | 1 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
DCDC_HGND | 2 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
HLDO_IN | 3 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
NC | 4 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
HLDO_OUT | 5 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
INP | 6 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
INN | 7 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
HGND | 8 | Not considered. Input side (hot side) is not connected to external supply. | N/A |
GND | 9 | Device is unpowered. OUTP and OUTN pins
are driven to GND. Observe that GND and DCDC_GND are diode connected. Device damage plausible. |
A |
OUTN | 10 | OUTN stuck high (VDD2). Excess current consumption from VDD source. Long-term damage plausible. | A |
OUTP | 11 | OUTP stuck high (VDD). Excess current consumption from VDD source. Long-term damage plausible. | A |
VDD | 12 | No effect. Normal operation. | D |
LDO_OUT | 13 | DC/DC converter is supplied from VDD. Device functions normally with increased power consumption from VDD source. Long-term damage plausible. | A |
DIAG | 14 | DIAG stuck high (VDD). Device operates normally with excessive power dissipation if DIAG is driven low (e.g. during statup). Long-term damage plausible. | A |
DCDC_GND | 15 | Device is unpowered. OUTP and OUTN pins are driven to GND. Observe that GND and DCDC_GND are diode connected. Device damage plausible. | A |
DCDC_IN | 16 | DC/DC converter is supplied from VDD. Device functions normally with increased power consumption from VDD source. Long-term damage plausible. | A |