SFFS496 June 2022 LMG1025-Q1
This section provides a failure mode analysis (FMA) for the pins of the LMG1025-Q1. The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality. |
B | No device damage, but loss of functionality. |
C | No device damage, but performance degradation. |
D | No device damage, no impact to functionality or performance. |
Figure 4-1 shows the LMG1025-Q1 pin diagram. For a detailed description of the device pins, see the Pin Configuration and Functions section in the LMG1025-Q1 data sheet.
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN+ | 1 | OUTH/L stuck low. | B |
GND | 2 | No effect. | D |
VDD | 3 | No power is applied to the device. | D |
OUTH | 4 | OUTH/L stuck low. Possible damage to OUTH driver. | A |
OUTL | 5 | OUTH/L stuck low. Possible damage to OUTH driver. | A |
IN- | 6 | OUTH/L follows IN+ command. | B |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN+ | 1 | OUTH/L stuck low. | B |
GND | 2 | No power is applied to device. OUH/L pulled up to VDD. | B |
VDD | 3 | No power is applied to device. | D |
OUTH | 4 | OUTH is disconnected from the power stage gate. | D |
OUTL | 5 | OUTL is disconnected from the power stage gate. | D |
IN- | 6 | OUTH/L stuck low. IN- is pulled up. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|---|
IN+ | 1 | GND | OUTH/L stuck low. | B |
GND | 2 | VDD | No power is applied to device. | D |
OUTH | 4 | OUTL | OUTH/L unknown. Possible damage to OUTH/L driver | A |
OUTL | 5 | IN- | OUTH/L unknown. Possible damage to IN- I/O and OUTL driver. | A |
Pin Name | Pin No. | Description of Potential Failure Effect(s) | Failure Effect Class |
---|---|---|---|
IN+ | 1 | OUTH/L stuck high. | B |
GND | 2 | No power is applied to device. | D |
VDD | 3 | No effect. Short to same potential. | D |
OUTH | 4 | OUTH/L stuck high. Possible damage to OUTL driver. | A |
OUTL | 5 | OUTH/L stuck high. Possible damage to OUTL driver. | A |
IN- | 6 | OUTH/L stuck low. | B |