SFFS550 March 2024 OPA2607-Q1 , OPA607-Q1
Figure 4-2 shows the OPAx607-Q1 pin diagram for the DGK package. For a detailed description of the device pins, see the Pin Configuration and Functions section in the OPAx607-Q1 data sheet.
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT1 | 1 | Short to GND may cause device to overheat. | B |
IN1- | 2 | Input at VS- (GND) is valid input, however, desired application result is unlikely. | C |
IN1+ | 3 | Input at VS- (GND) is valid input, however, desired application result is unlikely. | C |
VS- | 4 | Normal Operation if single supply configuration is used. | D |
OUT2 | 5 | May cause device to overheat. | B |
IN2+ | 6 | Input at VS- (GND) is valid input, however, desired application result is unlikely. | C |
IN2- | 7 | Input at VS- (GND) is valid input, however, desired application result is unlikely. | C |
VS+ | 8 | Diodes from input to VS+ may turn on due to input signal and cause electrical overstress (EOS). | A |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT1 | 1 | Output can be left open. There is no effect on the device, but the output will not be measured. | C |
IN1- | 2 | Floating input; circuit will likely not function as expected. | C |
IN1+ | 3 | Floating input; circuit will likely not function as expected. | C |
VS- | 4 | Lowest voltage output pin will try to power the VS- pin of the device. | B |
OUT2 | 5 | Output can be left open. There is no effect on the device, but the output will not be measured. | C |
IN2+ | 6 | Floating input; circuit will likely not function as expected. | C |
IN2- | 7 | Floating input; circuit will likely not function as expected. | C |
VS+ | 8 | Highest voltage output pin will try to power the VS+ pin of the device. | B |
Pin Name | Pin No. | Shorted to | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|---|
OUT1 | 1 | IN1- | Channel 1 configured in unity gain. | C |
IN1- | 2 | IN1+ | No damage to device. Application circuit will not work. | C |
IN1+ | 3 | VS- | Input at V- (GND) is valid input, however, desired application result is unlikely. | C |
VS- | 4 | IN2+ | Input at V- (GND) is valid input, however, desired application result is unlikely. Pins are not adjacent to each other. | C |
IN2+ | 5 | IN2- | No damage to device. Application circuit will not work. | C |
IN2- | 6 | OUT2 | Channel 2 configured in unity gain | C |
OUT2 | 7 | VS+ | Short to VS+ may cause device to overheat. | B |
VS+ | 8 | OUT1 | Short to VS+ may cause device to overheat. Pins are not adjacent to each other. | B |
Pin Name | Pin No. | Description of Potential Failure Effects | Failure Effect Class |
---|---|---|---|
OUT1 | 1 | Short to VS+ may cause device to overheat. | B |
IN1- | 2 | Input at VS+ (GND) is valid input, however, desired application result is unlikely. | C |
IN1+ | 3 | Input at VS+ (GND) is valid input, however, desired application result is unlikely. | C |
VS- | 4 | Diodes from input to VS- may turn on due to input signal and cause electrical overstress (EOS). | A |
OUT2 | 5 | Short to VS+ may cause device to overheat. | B |
IN2+ | 6 | Input at VS+ (GND) is valid input, however, desired application result is unlikely. | C |
IN2- | 7 | Input at VS+ (GND) is valid input, however, desired application result is unlikely. | C |
VS+ | 8 | Normal operation. | D |