SFFS573 February 2023 TLVM13610
This section provides Functional Safety Failure In Time (FIT) rates for TLVM13610 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total Component FIT Rate | 28 |
Die FIT Rate | 6 |
Package FIT Rate | 22 |
The failure rate and mission profile information in #GUID-7055D703-C997-4DC0-84AC-E9F3D6A7F682/TABLE21 comes from the Reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS/BICMOS ASICs Analog & Mixed = < 50-V supply | 25 FIT | 55°C |
The Reference FIT Rate and Reference Virtual TJ (junction temperature) in #GUID-7055D703-C997-4DC0-84AC-E9F3D6A7F682/TABLE22 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.