SFFS578A February 2023 – January 2024 INA241A-Q1 , INA241B-Q1 , INA296A-Q1 , INA296B-Q1
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This document contains information for the INA241x-Q1 and INA296x-Q1 (DDF-8, DGK-8, DGS-10 and D-8 packages) to aid in a functional safety system design. Information provided are:
Figure 1-1 shows the device functional block diagram for reference.
The INA241x-Q1 and INA296x-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.
This section provides functional safety failure in time (FIT) rates for the DDF-8, DGK-8, DGS-10 and D-8 packages of the INA241x-Q1 and INA296x-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total component FIT rate | 6 (DDF-8); 8 (DGK-8, DGS-10); 11 (D-8) |
Die FIT rate | 4 |
Package FIT rate | 2 (DDF-8); 4 (DGK-8, DGS-10); 7 (D-8) |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog, or mixed | 25 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.
The failure mode distribution estimation for the INA241x-Q1 and INA296x-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
Die Failure Modes | Failure Mode Distribution (%) |
---|---|
Output open (Hi-Z) | 10 |
Output to GND | 30 |
Output to VS | 30 |
Output functional, not in specification | 10 |
Pin to pin short, any two pins | 20 |
This section provides a failure mode analysis (FMA) for the pins of the INA241x-Q1 and INA296x-Q1 (DDF-8, DGK-8, DGS-10 and D-8 packages). The failure modes covered in this document include the typical pin-by-pin failure scenarios:
Table 4-2 through Table 4-5 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.
Class | Failure Effects |
---|---|
A | Potential device damage that affects functionality |
B | No device damage, but loss of functionality |
C | No device damage, but performance degradation |
D | No device damage, no impact to functionality or performance |
Following are the assumptions of use and the device configuration assumed for the pin FMA in this section: