SFFS578A February 2023 – January 2024 INA241A-Q1 , INA241B-Q1 , INA296A-Q1 , INA296B-Q1
This section provides functional safety failure in time (FIT) rates for the DDF-8, DGK-8, DGS-10 and D-8 packages of the INA241x-Q1 and INA296x-Q1 based on two different industry-wide used reliability standards:
FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) |
---|---|
Total component FIT rate | 6 (DDF-8); 8 (DGK-8, DGS-10); 11 (D-8) |
Die FIT rate | 4 |
Package FIT rate | 2 (DDF-8); 4 (DGK-8, DGS-10); 7 (D-8) |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
Table | Category | Reference FIT Rate | Reference Virtual TJ |
---|---|---|---|
5 | CMOS,
BICMOS Digital, analog, or mixed | 25 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.