SFFS587 February   2023 TLVM23625

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

Overview

This document contains information for the TLVM23625 (QFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (pin FMA)

#GUID-E488EBD4-511E-41B0-B770-91A9719CA4DD shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

The TLVM23625 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.