SFFS588 February   2023 TPS4H000-Q1

 

  1.   Trademarks
  2. 1Overview
  3. 2Functional Safety Failure In Time (FIT) Rates
  4. 3Failure Mode Distribution (FMD)
  5. 4Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for TPS4H000-Q1 (HTSSOP package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

#GUID-E488EBD4-511E-41B0-B770-91A9719CA4DD shows the device functional block diagram for reference.

GUID-0C12EEC5-4A9D-4EDA-96DA-569590F89C58-low.gifFigure 1-1 Functional Block Diagram

TPS4H000-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.