1 Overview

This document contains information for the TPSI310x-Q1, TPSI311x-Q1, TPSI312x-Q1, and TPSI3133-Q1 family and the TPSI310x, TPSI311x, TPSI312x, and TPSI3133 family (SSOP package) to aid in a functional safety system design. Information provided are:

• Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Failure mode distribution (FMD)
• Pin failure mode analysis (pin FMA)

Functional Block Diagram shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

The device family was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.